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Here is what some researchers have to say about Commercial Crystal Laboratories' substrates:

K.S. Harshavardhan of Neocera, Inc.
"The minimum channeling yield ( X min) as measured by Rutherford Backscattering is 3%, which is the best we have measured so far. The surfaces are atomically smooth and are excellent for epitaxial growth."

Scott Mathews of Optex Communications Corporation
"Our XRD and AFM analysis indicate that of the four vendors evaluated, Commercial Crystal substrates are the finest in terms of both orientation and surface quality."

Katharine Youden of Stanford University
"For MgO, Atomic Force Measurements indicate an average RMS surface roughness of 2.9 Angstrom which is less than the unit cell dimension."

Send e-mail questions or comments about this web site to Mike Urbanik.
Posted 1:16:01 PMSunday, April 1, 2001
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